✦ LIBER ✦
Exceptional operative gate voltage induces negative bias temperature instability (NBTI) on n-type trench DMOS transistors
✍ Scribed by S. Aresu; W. Kanert; R. Pufall; M. Goroll
- Book ID
- 108210726
- Publisher
- Elsevier Science
- Year
- 2007
- Tongue
- English
- Weight
- 201 KB
- Volume
- 47
- Category
- Article
- ISSN
- 0026-2714
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