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A method for contact resistivity measurement using thick, uniformly doped substrates

✍ Scribed by S.S. Winterton; N.G. Tarr

Publisher: Elsevier Science
Year: 1986
Tongue: English
Weight: 356 KB
Volume: 29
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(86)90093-6

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