✦ LIBER ✦
The use of the Fresnel method for the characterisation of a short-period strained Ge/Si multilayer: II. Measurement of a layer-thickness irregularity
✍ Scribed by W.C. Shih; W.M. Stobbs
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 979 KB
- Volume
- 35
- Category
- Article
- ISSN
- 0304-3991
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