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A mechanism and a reduction technique for large reverse leakage current in p-n junctions

โœ Scribed by Ohyu, K.; Ohkura, M.; Hiraiwa, A.; Watanabe, K.


Book ID
114536131
Publisher
IEEE
Year
1995
Tongue
English
Weight
811 KB
Volume
42
Category
Article
ISSN
0018-9383

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