Gated-diode study of corner and peripheral leakage current in high-energy neutron irradiated silicon p-n junctions

✍ Scribed by Czerwinski, A.; Simoen, E.; Poyai, A.; Claeys, C.; Ohyama, H.

• Book ID: 114663619
• Publisher: IEEE
• Year: 2003
• Tongue: English
• Weight: 579 KB
• Volume: 50
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/tns.2003.809469