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A four-step method for de-embedding gigahertz on-wafer CMOS measurements

✍ Scribed by Kolding, T.E.

Book ID: 114538085
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 251 KB
Volume: 47
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.830987

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