✦ LIBER ✦
Improved three-step de-embedding method to accurately account for the influence of pad parasitics in silicon on-wafer RF test-structures
✍ Scribed by Vandamme, E.P.; Schreurs, D.M.M.-P.; Van Dinther, G.
- Book ID
- 111901917
- Publisher
- IEEE
- Year
- 2001
- Tongue
- English
- Weight
- 144 KB
- Volume
- 48
- Category
- Article
- ISSN
- 0018-9383
No coin nor oath required. For personal study only.