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A cyclotron as a high resolution mass spectrometer for fast secondary ions

✍ Scribed by G. Auger; W. Mittig; A. Lépine-Szily; L.K. Fifield; M. Bajard; E. Baron; D. Bibet; P. Bricault; J.M. Casandjian; M. Chabert; M. Chartier; J. Fermé; L. Gaudard; A. Gillibert; M. Lewitowicz; M.H. Moscatello; N.A. Orr; E. Plagnol; C. Ricault; A.C.C. Villari; Yang Yong Feng

Book ID: 107922656
Publisher: Elsevier Science
Year: 1994
Tongue: English
Weight: 744 KB
Volume: 350
Category: Article
ISSN: 0168-9002
DOI: 10.1016/0168-9002(94)91170-3

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