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A cross-sectional scanning tunneling microscopy study of IrO2 rutile single crystals

โœ Scribed by Woei Wu Pai; T.Y. Wu; C.H. Lin; B.X. Wang; Y.S. Huang; H.L. Chou


Book ID
108279554
Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
846 KB
Volume
601
Category
Article
ISSN
0039-6028

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Atomic scale characterization of cleaved surfaces of cubic GaN (c-GaN) epilayers was established in real space. Using cross-sectional scanning tunneling microscopy (XSTM), c-GaN epilayers grown on GaAs (001) by low pressure MOVPE were investigated. The analysis of STM observations revealed that the