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A critique of the Reliability Analysis Center failure-rate-model for plastic encapsulated microcircuits

✍ Scribed by Sinnadurai, N.; Shukla, A.A.; Pecht, M.

Book ID: 114555702
Publisher: IEEE
Year: 1998
Tongue: English
Weight: 452 KB
Volume: 47
Category: Article
ISSN: 0018-9529
DOI: 10.1109/24.722270

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