Microcircuit generic failure rates: By I. L. Krulac, Reliability Analysis Center. Available from the National Technical Information Service (NTIS), Springfield, CA 22151, U.S.A. for $30.00. Please cite AD-77 763K when ordering

• Publisher: Elsevier Science
• Year: 1974
• Tongue: English
• Weight: 44 KB
• Volume: 13
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(74)90450-8