Microcircuit device malfunction report: Published by the Reliability Analysis Center, Department of Defense. Available from the National Technical Information Service (NTIS) Springfield, CA 22151, U.S.A. for $40.00. Please cite AD-779 310K when ordering

• Publisher: Elsevier Science
• Year: 1974
• Tongue: English
• Weight: 44 KB
• Volume: 13
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(74)90451-x