✦ LIBER ✦

A concurrent testing technique for digital circuits

✍ Scribed by Saluja, K.K.; Sharma, R.; Kime, C.R.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Testing digital circuits: guidelines for

✍ Bennetts, R.G. 📂 Article 📅 1979 🏛 Institution of Electrical Engineers ⚖ 264 KB

Concurrent test for digital linear syste

✍ Bayraktaroglu, I.; Orailoglu, A. 📂 Article 📅 2001 🏛 IEEE 🌐 English ⚖ 197 KB

A New ATPG Technique (ExpoTan) for Testi

✍ Varaprasad, B. K. S. V. L.; Patnaik, L. M.; Jamadagni, H. S.; Agrawal, V. K. 📂 Article 📅 2007 🏛 IEEE 🌐 English ⚖ 468 KB

Statistical resistance to detection [dig

✍ Boneh, A.; Savir, J. 📂 Article 📅 1992 🏛 IEEE 🌐 English ⚖ 371 KB

A Non-Enumerative Technique for Measurin

✍ Stelios N. Neophytou, Kyriakos Christou, Maria K. Michael 📂 Article 📅 2012 🏛 Springer US 🌐 English ⚖ 740 KB

A structure and technique for pseudorand

✍ Fidel Muradali; Takao Nishida; Tsuguo Shimizu 📂 Article 📅 1995 🏛 Springer US 🌐 English ⚖ 742 KB