✦ LIBER ✦

Statistical resistance to detection [digital circuits testing]

✍ Scribed by Boneh, A.; Savir, J.

Book ID: 119771785
Publisher: IEEE
Year: 1992
Tongue: English
Weight: 371 KB
Volume: 41
Category: Article
ISSN: 0018-9340
DOI: 10.1109/12.123388

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