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A structure and technique for pseudorandom-based testing of sequential circuits

✍ Scribed by Fidel Muradali; Takao Nishida; Tsuguo Shimizu

Publisher
Springer US
Year
1995
Tongue
English
Weight
742 KB
Volume
6
Category
Article
ISSN
0923-8174

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πŸ“œ SIMILAR VOLUMES

Static test compaction for IDDQ testing
Static test compaction for IDDQ testing of bridging faults in sequential circuits
✍ Yoshinobu Higami; Kewal K. Saluja; Yuzo Takamatsu; Kozo Kinoshita πŸ“‚ Article πŸ“… 2000 πŸ› John Wiley and Sons 🌐 English βš– 335 KB πŸ‘ 2 views

This paper presents a static test compaction method for IDDQ testing of sequential circuits. Test compaction reduces test application time and tester memory and consequently reduces testing cost. Particularly for IDDQ testing, measurement of IDDQ is time-consuming, and thus test compaction is a very