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A concurrent error detection IC in 2-μm static CMOS logic

✍ Scribed by Jien-Chung Lo; Shih-Yao Sun; Daly, J.C.

Book ID: 119773999
Publisher: IEEE
Year: 1994
Tongue: English
Weight: 479 KB
Volume: 29
Category: Article
ISSN: 0018-9200
DOI: 10.1109/4.284710

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