✦ LIBER ✦
On the SiO2-based gate-dielectric scaling limit for low-standby power applications in the context of a 0.13 μm CMOS logic technology
✍ Scribed by Yo-Sheng Lin; Huan-Tsung Huang; Chung-Cheng Wu; Ying-Keung Leung; Hsu-Yang Pan; Tse-En Chang; Wei-Ming Chen; Jung-Jih Liaw; Diaz, C.H.
- Book ID
- 114539020
- Publisher
- IEEE
- Year
- 2002
- Tongue
- English
- Weight
- 238 KB
- Volume
- 49
- Category
- Article
- ISSN
- 0018-9383
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