๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

A Class of Test Generators for Built-In Testing

โœ Scribed by Aboulhamid, M.E.; Cerny, E.

Book ID
114606615
Publisher
IEEE
Year
1983
Tongue
English
Weight
629 KB
Volume
C-32
Category
Article
ISSN
0018-9340

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## Abstract Recently current testing is beginning to be noticed as a testing method for CMOS circuits. However, since CMOS circuits cause the dynamic current due to switching, it has been pointed out that testing at a fast clock rate by current testing is difficult. To cope with this problem a buil