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GLFSR-a new test pattern generator for built-in-self-test

✍ Scribed by Pradhan, D.K.; Chatterjee, M.


Book ID
119778426
Publisher
IEEE
Year
1999
Tongue
English
Weight
302 KB
Volume
18
Category
Article
ISSN
0278-0070

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## Abstract The self‐test of built‐in RAMs is an excellent method to simplify the testing of VLSI. This paper considers the built‐in self‐test using the linear feedback shift registers on the pseudorandom input generator and the output signature analyzer. It is demonstrated that the method is usefu