𝔖 Bobbio Scriptorium

✦ LIBER ✦

560. Possibilities of utilization of microanalysis with the aid of secondary ions in problems of semiconductors: S E Richter et al, Proc Int Work Conf on Ion Implant in Semicon, Rossendorf 1972, 183–189 (in Russian).

Publisher: Elsevier Science
Year: 1974
Tongue: English
Weight: 172 KB
Volume: 24
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(74)92074-0

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508. Investigation of radiation defects

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