✦ LIBER ✦

4970724 Redundancy and testing techniques for IC wafers

✍ Scribed by MichaelW Yung

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

4812756 Contactless technique for semico

✍ Huntington Curtis; Min-Su Fung; Roger Verkuil 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 72 KB

Symposium on redundancy techniques for c

✍ Miss Josephine Leno; Richard H. Wilcox 📂 Article 📅 1961 🏛 John Wiley and Sons 🌐 English ⚖ 55 KB

Computational techniques for optimizing

✍ Claude Henin 📂 Article 📅 1972 🏛 John Wiley and Sons 🌐 English ⚖ 772 KB

4755746 Apparatus and methods for semico

✍ Cheste Mallory; DavidS Perloff; Hung Pham; Sandor Droblisch 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 185 KB

Stress analysis and bending tests for Ga

✍ W. Dreyer; F. Duderstadt; S. Eichler; M. Jurisch 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 618 KB

Non-contact charge-voltage method for di

✍ Piotr Edelman; Dmitriy Marinskiy; Carlos Almeida; Joseph N. Kochey; Anton Byelya 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 258 KB