๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

4709366 Computer assisted fault isolation in circuit board testing

โœ Scribed by Marshall Scott; JohnD Polstra


Book ID
103282938
Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
84 KB
Volume
28
Category
Article
ISSN
0026-2714

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Parallel testing of parametric faults in
๐Ÿ“‚ Article ๐Ÿ“… 1988 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 99 KB

A testable design of dynamic random-access memory (DRAM) architecture which allows one to access multiple cells in a word line simultaneously is presented. The technique utilises the two-dimensional (2-D) organisation of the DRAM and the resulting speedup of the conventional algorithm is considerabl