✦ LIBER ✦

4581740 Transfer circuit for defect inspection of an integrated circuit

✍ Scribed by Tsune Kinoshita

Publisher: Elsevier Science
Year: 1987
Tongue: English
Weight: 182 KB
Volume: 27
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(87)90746-3

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

4774461 System for inspecting exposure p

4774461 System for inspecting exposure pattern data of semiconductor integrated circuit device

✍ Shogo Matsui; Kunihiko Shiozawa; Kenichi Kobayashi 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 93 KB

An electron imaging system for the fabri

An electron imaging system for the fabrication of integrated circuits

✍ T.W. O'Keeffe; J. Vine; R.M. Handy 📂 Article 📅 1969 🏛 Elsevier Science 🌐 English ⚖ 522 KB

4534605 Symmetrical, single point drive

4534605 Symmetrical, single point drive for contacts of an integrated circuit tester

✍ NicolasJ Cedrone; KennethR Lee 📂 Article 📅 1986 🏛 Elsevier Science 🌐 English ⚖ 81 KB

Design of an isolated capacitor cell for

Design of an isolated capacitor cell for three-dimensional RF circuit integration

✍ Dae Jun Kim; Young Chul Lee; Byeong Gun Choi; Ki Chan Eun; Chul Soon Park 📂 Article 📅 2003 🏛 John Wiley and Sons 🌐 English ⚖ 112 KB

## Abstract A compact multilayer capacitor cell isolated with perforated ground was designed and fabricated using low‐temperature ceramic co‐firing (LTCC) technology for three‐dimensional (3D) RF circuit application. The vertical transmission from any interferer placed 114 μm above the capacitor ce

4929081 System for detecting defects in

4929081 System for detecting defects in a regularly arranged pattern such as an integrated circuit or the like

✍ Yoko Yamamoto; Hitoshi Tanaka; Noboru Mikami 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 177 KB

4811344 Device for the testing and check

4811344 Device for the testing and checking of the operation of blocks within an integrated circuit

✍ Gerard Chauvel; Jean Ciroux 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 77 KB