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3D-Analysis of Complex Microstructures : Quantification and Classification by FIB/SEM-Nanotomography

✍ Scribed by Alexandra Velichko; Frank Mücklich


Book ID
102866599
Publisher
Wiley (John Wiley & Sons)
Year
2007
Weight
692 KB
Volume
9
Category
Article
ISSN
1439-4243

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✦ Synopsis


A precise design of complex microstructural features calls for adequate 3D characterization. For the example an automatic classification of local graphite morphologies was developed for application of advanced cast iron in high performing functional gradient materials. FIB/SEM Nanotomography was combined with a computer simulation to measure a reliable probability distribution of random 2D sections through reconstructed 3D particles. The procedure is applicable for other complex microstructures.


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