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Imaging of Cell-to-Material Interfaces by SEM after in situ Focused Ion Beam Milling on Flat Surfaces and Complex 3D-Fibrous Structures

✍ Scribed by Anne Greet Bittermann; Claus Burkhardt; Heike Hall


Publisher
John Wiley and Sons
Year
2009
Tongue
English
Weight
765 KB
Volume
11
Category
Article
ISSN
1438-1656

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