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TEM/SEM investigation of microstructural changes within the white etching area under rolling contact fatigue and 3-D crack reconstruction by focused ion beam

✍ Scribed by A. Grabulov; U. Ziese; H.W. Zandbergen


Book ID
113896829
Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
766 KB
Volume
57
Category
Article
ISSN
1359-6462

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