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3953. Rate and pressure dependence of contaminants in vacuum-deposited aluminum films. (USA)


Book ID
108389990
Publisher
Elsevier Science
Year
1979
Tongue
English
Weight
144 KB
Volume
29
Category
Article
ISSN
0042-207X

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๐Ÿ“œ SIMILAR VOLUMES


Orientation and thickness dependence of
โœ M. Fukamachi; S. Nagakura; S. Oketani ๐Ÿ“‚ Article ๐Ÿ“… 1966 ๐Ÿ› Elsevier Science โš– 395 KB

## Orientation and thickness dependence of stress-strain curves in vacuum deposited single crystal silver films\* Mechanical properties of thin f.c.c. metal films formed by vacuum deposition have been studied by several authors.~~-?j Thev reported that the stress-" strain curves of the deposited f