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Dependence of defect density and activation energy on deposition rates in silver films

✍ Scribed by Narayandas, K. ;Radhakrishnan, M. ;Balasubramanian, C.


Book ID
105374196
Publisher
John Wiley and Sons
Year
1979
Tongue
English
Weight
289 KB
Volume
56
Category
Article
ISSN
0031-8965

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Europium overlayers on a polycrystalline silver substrate have been studied by X-ray photoelectron spectroscopy. Eu was deposited at rates of 0.4 A/min and 0.8 Almin. Ag 3d emission attenuation profiles show a distinct dependence on Eu evaporation rates. Sizeable Ag core level shifts upon deposition