Defect density variation with deposition rate in snsb thin films from annealing study of electrical resistance

✍ Scribed by V. Damodara Das; M.S. Jagadeesh

• Publisher: Elsevier Science
• Year: 1977
• Tongue: English
• Weight: 819 KB
• Volume: 38
• Category: Article
• ISSN: 0022-3697
• DOI: 10.1016/0022-3697(77)90161-5