✦ LIBER ✦
Defect density and electrical properties of vacuum evaporated copper films from annealing studies of electrical resistance : K. Narayandas, M. Radhakrishnan and C. Balasubramanian. Electrocomponent Sci. Technol.9, 171 (1982)
- Publisher
- Elsevier Science
- Year
- 1983
- Tongue
- English
- Weight
- 110 KB
- Volume
- 23
- Category
- Article
- ISSN
- 0026-2714
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