Specimens of spruce (Picea abies) were taken to compression failure in the SEM while the backscattered electron imaging was used. Control specimens were taken to failure with no beam exposure. Failure morphology was studied using the secondary electron imaging. Wood exposed to the electron beam duri
โฆ LIBER โฆ
20KeV electron-beam annealing of defects in GaAsP during SEM measurement
โ Scribed by T. Wada; K. Sakurai
- Book ID
- 103810341
- Publisher
- Elsevier Science
- Year
- 1983
- Weight
- 585 KB
- Volume
- 116
- Category
- Article
- ISSN
- 0378-4363
No coin nor oath required. For personal study only.
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