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“1/f” noise in thin metal films interacting with silicon substrates

✍ Scribed by R.W. Bené; G.S. Lee; N.I. Cho

Publisher: Elsevier Science
Year: 1985
Tongue: English
Weight: 473 KB
Volume: 129
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(85)90046-x

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