Interface interaction between thin films of transition metal compounds and silicon substrates across the native SiO2 layer

✍ Scribed by S. Witanachchi; H. Weerasingha; H. Abou Mourad; P. Mukherjee

• Publisher: Elsevier Science
• Year: 2010
• Tongue: English
• Weight: 358 KB
• Volume: 405
• Category: Article
• ISSN: 0921-4526
• DOI: 10.1016/j.physb.2009.08.059