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18O studies of altered layers formed in Si and SiO2 by ion bombardment

✍ Scribed by J.A. Kilner; G.P. Beyer; R.J. Chater

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Ion bombardment of SiO2/Si and Si measur

✍ E. Chason; T.M. Mayer; D. McIlroy; C.M. Matzke 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 460 KB

SIMS and 18O tracer studies of the redis

✍ J.A. Kilner; R.J. Chater; P.L.F. Hemment; R.F. Peart; E.A. Maydell-Ondrusz; M.R. 📂 Article 📅 1985 🏛 Elsevier Science 🌐 English ⚖ 529 KB

XPS studies of SiO2 surface layers forme

✍ Schulze, D. ;Finster, J. ;Hensel, E. ;Skorupa, W. ;Kreissig, U. 📂 Article 📅 1983 🏛 John Wiley and Sons 🌐 English ⚖ 203 KB

Distribution of ion-bombardment implante

✍ Lukáč, P. ;Jesenák, V. 📂 Article 📅 1979 🏛 John Wiley and Sons 🌐 English ⚖ 400 KB

Nonplanar and noncontinuous buried layer

✍ P.L.F. Hemment; K.J. Reeson; A.K. Robinson; J.A. Kilner; R.J. Chater; C.D. Marsh 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 405 KB

18O isotope studies on the redistributio

✍ R.J. Chater; J.A. Kilner; K.J. Reeson; A.K. Robinson; P.L.F. Hemment 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 530 KB