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Zygo interferometer for measuring refractive index of photorefractive bismuth silicon oxide (Bi12SiO20) crystal

✍ Scribed by R.P. Shukla; D.V. Udupa; M.D. Aggarwal

Publisher: Elsevier Science
Year: 1998
Tongue: English
Weight: 186 KB
Volume: 30
Category: Article
ISSN: 0030-3992
DOI: 10.1016/s0030-3992(98)00076-0

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