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Electrooptic measurement of the volume resistivity of bismuth silicon oxide (Bi12SiO20)

✍ Scribed by David A. Seery; Mark H. Garrett; Armand R. Tanguay Jr.


Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
691 KB
Volume
85
Category
Article
ISSN
0022-0248

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