## Abstract InAs coβdoped ZnO films were grown on sapphire substrates by pulsed laser deposition. The grown films have been characterized using Xβray diffraction (XRD), Hall effect measurements, Atomic force microscope (AFM) and Field emission scanning electron microscope (FESEM) in order to invest
β¦ LIBER β¦
ZnO thin films prepared by pulsed laser deposition
β Scribed by M.G. Tsoutsouva; C.N. Panagopoulos; D. Papadimitriou; I. Fasaki; M. Kompitsas
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 487 KB
- Volume
- 176
- Category
- Article
- ISSN
- 0921-5107
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