ZnO thin film characterization by X-ray reflectivity optimization using genetic algorithm and Fourier transformation

✍ Scribed by Ghahraman Solookinejad; Amir Sayid Hassan Rozatian; Mohammad Hossein Habibi

• Book ID: 116244618
• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 211 KB
• Volume: 258
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/j.apsusc.2011.08.043