✦ LIBER ✦

Yield modeling of elliptical defect

✍ Scribed by Junping Wang; Yue Hao; Zhuokui Zhang; Chunli Ren; Kang Li; Jianping Fang

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Role of defect size distribution in yiel

✍ Ferris-Prabhu, A.V. 📂 Article 📅 1985 🏛 IEEE 🌐 English ⚖ 797 KB

Chip yield modeling related to photolith

✍ Z. Stamenković; N. Stojadinović 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 344 KB

Equivalence proofs of some yield modelin

✍ Thibeault, C.; Savaria, Y.; Houle, J.L. 📂 Article 📅 1995 🏛 IEEE 🌐 English ⚖ 422 KB

Singular solutions of the elliptic sine-

✍ A.G. Shagalov 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 413 KB

Novel yield model for integrated circuit

✍ Lee-Ing Tong; Li-Chang Chao 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 560 KB

Rigorous Optical Modeling of Elliptical

✍ Ben Salem, A.; Cherif, R.; Zghal, M. 📂 Article 📅 2012 🏛 Optical Society of America 🌐 English ⚖ 856 KB