Equivalence proofs of some yield modeling methods for defect-tolerant integrated circuits

✍ Scribed by Thibeault, C.; Savaria, Y.; Houle, J.L.

• Book ID: 119772328
• Publisher: IEEE
• Year: 1995
• Tongue: English
• Weight: 422 KB
• Volume: 44
• Category: Article
• ISSN: 0018-9340
• DOI: 10.1109/12.381962