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XRF and SIMS/SNMS analyses of BaxSr1−xTiO3dielectrics

✍ Scribed by U. Breuer; W. Krumpen; F. Fitsilis

Book ID: 105888119
Publisher: Springer
Year: 2003
Tongue: English
Weight: 637 KB
Volume: 375
Category: Article
ISSN: 1618-2650
DOI: 10.1007/s00216-003-1806-4

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