Spectroscopic Ellipsometry of BaxSr1?xTi
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Yang, Sheng-Hong ;Mo, Dang ;Tian, Hu-Yong ;Luo, Wei-Gen ;Pu, Xing-Hua ;Ding, Ai-
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Article
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2002
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John Wiley and Sons
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English
⚖ 107 KB
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Stoichiometric Ba x Sr 1Àx TiO 3 (BST) thin films with various values of x were prepared on Si(100) substrates by the sol-gel method. The influence of Sr content on the structure and the optical properties was studied by X-ray diffraction (XRD) and spectroscopic ellipsometry (SE) in the UV-visible r