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XRD Characterization of thin films with low intensity reflection lines

✍ Scribed by J Musil; AJ Bell; M Čepera; J Zeman

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 275 KB
Volume: 47
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(96)00193-5

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