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XPS study of Pb/YBaCuO thin-film tunnel contact

✍ Scribed by T.J. Šarapatka; P. Mikušík


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
450 KB
Volume
68
Category
Article
ISSN
0169-4332

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An XPS study of GaN thin films on GaAs
✍ R. Carin; J. P. Deville; J. Werckmann 📂 Article 📅 1990 🏛 John Wiley and Sons 🌐 English ⚖ 476 KB

## Abstract The energies of photoelectron and Auger lines of gallium and nitrogen in GaN thin films obtained by reactive sputtering are derived. From previous RBS investigations, such were found to be stoichiometric in the bulk. The XPS surface analysis of the films gives a chemical content of ∼20%