𝔖 Bobbio Scriptorium
✦   LIBER   ✦

XPS studies of dc and ac anodic films on aluminium formed in sulphuric acid

✍ Scribed by J.A. Treverton; N.C. Davies

Book ID
107748999
Publisher
Elsevier Science
Year
1980
Tongue
English
Weight
564 KB
Volume
25
Category
Article
ISSN
0013-4686

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

SSIMS, XPS and microstructural studies o
SSIMS, XPS and microstructural studies of ac-phosphoric acid anodic films on aluminium
✍ D. Johnson; J. C. Vickerman; R. H. West; J. A. Treverton; J. Ball πŸ“‚ Article πŸ“… 1990 πŸ› John Wiley and Sons 🌐 English βš– 746 KB

## Abstract ac‐Phosphoric acid anodizing of aluminium results in the initial formation of a featureless barrier film on the metal surface, followed by nucleation and growth of a filament structure. The rate of filament growth and filament diameter are dependent upon the anodizing temperature. Stati

Some impedance measurements of anodic fi
Some impedance measurements of anodic films formed on tantalum and niobium in sulphuric acid
✍ P.H.G. Draper πŸ“‚ Article πŸ“… 1963 πŸ› Elsevier Science 🌐 English βš– 405 KB

The variations of the equivalent parallel resistance and capacitance of anodic films formed on Ta and Nb in varying concentrations of H2SO4 suggest that the volume of film formed per coulomb is much greater in 100)~, acid, although the dielectric constant is substantially unchanged. The field requir

Galvanoluminescence during the pore-fill
Galvanoluminescence during the pore-filling of anodic films on aluminum formed in sulphuric acid
✍ S. Ikonopisov; A. Girginov; M. Machkova πŸ“‚ Article πŸ“… 1989 πŸ› Elsevier Science 🌐 English βš– 283 KB

The galvanoluminescent brightness on filling of porous films obtained in H,SO, solution is studied. It is found that the matrix of the porous film which is filled up contributes to the light emission. It is also found that the light yield increases with growing thickness of the films on completely f

XPS Characterization of the Corrosion Fi
XPS Characterization of the Corrosion Films Formed on Nanocrystalline Ni-P Alloys in Sulphuric Acid
✍ Splinter, S. J.; Rofagha, R.; McIntyre, N. S.; Erb, U. πŸ“‚ Article πŸ“… 1996 πŸ› John Wiley and Sons 🌐 English βš– 601 KB

X-ray photoelectron spectroscopy (XPS) was used to examine the corrosion films formed on nanocrystalline (nc) and amorphous Ni-P alloys in 0.1 M H,SO,. Neither the nc nor the amorphous alloys were found to exhibit passivity. An enrichment of elemental P compared to Ni was observed at the surface of