Laser Raman spectroscopy (LRS), X-ray di4raction (XRD), X-ray photoelectron spectroscopy (XPS), ultraviolet and di4use re6ectance spectroscopy (UV-DRS), and temperature-programmed reduction (TPR) are used to characterize a series of TiO 2 / -Al 2 O 3 , NiO/ -Al 2 O 3 , and NiO/TiO 2 / -Al 2 O 3 samp
XPS investigations of Pt and Rh supported on γ-Al2O3 and TiO2
✍ Scribed by T. Huizinga; H.F.J. Van 'T Blik; J.C. Vis; R. Prins
- Publisher
- Elsevier Science
- Year
- 1983
- Weight
- 57 KB
- Volume
- 135
- Category
- Article
- ISSN
- 0167-2584
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