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XPS and SSIMS analysis of polymers: The effect of remote nitrogen plasma treatment on polyethylene, poly(ethylene vinyl alcohol) and poly(ethylene terephthalate)

✍ Scribed by R. Foerch; D. Johnson


Book ID
104592818
Publisher
John Wiley and Sons
Year
1991
Tongue
English
Weight
723 KB
Volume
17
Category
Article
ISSN
0142-2421

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✦ Synopsis


Abstract

A study has been undertaken in which both x‐ray photoelectron spectroscopy (XPS) and Fast atom bombardment static secondary ion mass spectrometry (FAB‐SSIMS) have been used to study the effects of remote nitrogen plasma treatment on polymers such as linear low‐density polyethylene (LLDPE), poly(ethylene vinyl alcohol) (EVOH) and poly(ethylene terephthalate) (PET). For comparison, remote oxygen plasma treatment was also performed on LLDPE. A very rapid uptake of nitrogen was observed for all polymers. Negative FAB‐SSIMS indicated CN^−^, CNO^−^ and C~2~N fragments on each of the nitrogen plasma‐treated polmers. Positive FAB‐SSIMS spectra of plasma‐treated LLDPE showed relatively high intensity, high mass fragments, thought to originate from additives. These were not observed for the other two polymers. Significant amounts of aromatic‐type fragments were observed in the positive FAB‐SSIMS spectra of all treated polymers. Surface stability studies have shown that for both nitrogen and oxygen plasma‐treaed LLDPE there is a substantial decrease in the surface functionality on exposure to air. This effect was much less prevalent for EVOH and PET.


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