XPS and SSIMS analysis of polymers: The
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R. Foerch; D. Johnson
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Article
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1991
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John Wiley and Sons
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English
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## Abstract A study has been undertaken in which both xβray photoelectron spectroscopy (XPS) and Fast atom bombardment static secondary ion mass spectrometry (FABβSSIMS) have been used to study the effects of remote nitrogen plasma treatment on polymers such as linear lowβdensity polyethylene (LLDP