𝔖 Bobbio Scriptorium
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XPS and SIMS characterization of metal oxide/amorphous silicon—carbon interfaces

✍ Scribed by A. Eicke; G. Bilger

Book ID
104592168
Publisher
John Wiley and Sons
Year
1988
Tongue
English
Weight
691 KB
Volume
12
Category
Article
ISSN
0142-2421

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