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Time-of-flight-SIMS and XPS characterization of metal doped polymers

✍ Scribed by Th. Gross; I. Retzko; J. Friedrich; W. Unger

Book ID: 108417862
Publisher: Elsevier Science
Year: 2003
Tongue: English
Weight: 115 KB
Volume: 203-204
Category: Article
ISSN: 0169-4332
DOI: 10.1016/s0169-4332(02)00769-9

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